A digital calibration technique for N-channel time-interleaved ADC based on simulated annealing algorithm. (March 2023)

• Record Type: Journal Article
• Authors: Zhang, Yuhao; Han, Chenxi; Liu, Shubin
• Is Part Of: Microelectronics journal. Volume 133(2023)
• Publication Date: 2023-03
• Subjects: Time-interleaved analog-to-digital converter -- Digital calibration -- Frequency response mismatches -- Differential filter -- Simulated annealing algorithm; Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2023.105701
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: This work proposes a digital calibration technique for time-interleaved analog-to-digital converters with any interleaving factor, which can calibrate gain, timing, and bandwidth mismatches. A simulated annealing algorithm is used to search the optimum calibration coefficients for the error correction module, possessing a customizable search range and precision. Furthermore, the calibration technique is effective for the single-tone, and multi-tone input signals in the whole Nyquist frequency. In the case of an 8-channel 12-bit TI-ADC with fixed mismatches, simulations show an SNDR improvement of 46.38 dB for a single-tone input and an SNDR improvement of 29.23 dB for a multi-tone input.