Producing Silicon Carbide Micro and Nanostructures by Plasma‐Free Metal‐Assisted Chemical Etching. (10th June 2021)
- Record Type:
- Journal Article
- Title:
- Producing Silicon Carbide Micro and Nanostructures by Plasma‐Free Metal‐Assisted Chemical Etching. (10th June 2021)
- Main Title:
- Producing Silicon Carbide Micro and Nanostructures by Plasma‐Free Metal‐Assisted Chemical Etching
- Authors:
- Michaels, Julian A.
Janavicius, Lukas
Wu, Xihang
Chan, Clarence
Huang, Hsieh‐Chih
Namiki, Shunya
Kim, Munho
Sievers, Dane
Li, Xiuling - Abstract:
- Abstract: Silicon carbide (SiC) is a wide bandgap third‐generation semiconductor well suited for harsh environment power electronics, micro and nano electromechanical systems, and emerging quantum technology by serving as hosts for quantum states via defect centers. The chemical inertness of SiC limits viable etching techniques to plasma‐based reactive ion etching methods; however, these could have significant undesirable effects for electronic and photonic devices. This paper presents a plasma‐free, open‐circuit, photo‐induced metal‐assisted chemical etch for fabricating micro and nanoscale features without the inherent high energy ion‐related surface damage. The method presented herein utilizes above bandgap ultraviolet light, patterned noble metal (Pt), and a solution consisting of an oxidant potassium persulfate (K2 S2 O8 ) and an acid, hydrofluoric acid, to spatially define the etching morphology. The parameter space is comprehensively explored to demonstrate the controllability and versatility of this technique to produce ordered arrays of micro and nanoscale SiC structures with porous or solid sidewalls, and to elucidate the etching mechanism. Abstract : Silicon carbide periodic hole arrays are produced via photo‐enhanced‐metal‐assisted chemical etching. This is an open‐circuit, plasma‐free, metal‐catalyzed highly‐anisotropic etching method. The surface morphology including porosity and smoothness can be tuned by the etch condition, potentially useful for powerAbstract: Silicon carbide (SiC) is a wide bandgap third‐generation semiconductor well suited for harsh environment power electronics, micro and nano electromechanical systems, and emerging quantum technology by serving as hosts for quantum states via defect centers. The chemical inertness of SiC limits viable etching techniques to plasma‐based reactive ion etching methods; however, these could have significant undesirable effects for electronic and photonic devices. This paper presents a plasma‐free, open‐circuit, photo‐induced metal‐assisted chemical etch for fabricating micro and nanoscale features without the inherent high energy ion‐related surface damage. The method presented herein utilizes above bandgap ultraviolet light, patterned noble metal (Pt), and a solution consisting of an oxidant potassium persulfate (K2 S2 O8 ) and an acid, hydrofluoric acid, to spatially define the etching morphology. The parameter space is comprehensively explored to demonstrate the controllability and versatility of this technique to produce ordered arrays of micro and nanoscale SiC structures with porous or solid sidewalls, and to elucidate the etching mechanism. Abstract : Silicon carbide periodic hole arrays are produced via photo‐enhanced‐metal‐assisted chemical etching. This is an open‐circuit, plasma‐free, metal‐catalyzed highly‐anisotropic etching method. The surface morphology including porosity and smoothness can be tuned by the etch condition, potentially useful for power electronics, MEMS, and quantum technologies. … (more)
- Is Part Of:
- Advanced functional materials. Volume 31:Number 32(2021)
- Journal:
- Advanced functional materials
- Issue:
- Volume 31:Number 32(2021)
- Issue Display:
- Volume 31, Issue 32 (2021)
- Year:
- 2021
- Volume:
- 31
- Issue:
- 32
- Issue Sort Value:
- 2021-0031-0032-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2021-06-10
- Subjects:
- 4H silicon carbide -- metal‐assisted chemical etching -- porosity -- Raman -- wet etching
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1616-3028 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adfm.202103298 ↗
- Languages:
- English
- ISSNs:
- 1616-301X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.853900
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 25876.xml