Experimental investigation into impacts of neutron irradiation on pMOS dosimeter behaviors. (February 2023)

• Record Type: Journal Article
• Authors: Li, Lei; Chen, Xiaochi; Liu, Xuqiang; Zeng, Guang; Yang, Guixia; Li, Zehong; Jian, Yuan
• Is Part Of: Radiation measurements. Volume 161(2022)
• Publication Date: 2023-02
• Subjects: p-channel metal–oxide–semiconductor dosimeter -- Threshold voltage -- Ionization dose -- Neutron irradiation -- Annealing effect; Nuclear emulsions -- Periodicals; Particle tracks (Nuclear physics) -- Periodicals; Thermoluminescence -- Periodicals; Cosmic rays -- Periodicals; Radiation -- Measurement -- Periodicals; Radiometry -- Periodicals; Radiation Monitoring -- Periodicals; Émulsions nucléaires -- Périodiques; Particules (Physique nucléaire) -- Traces -- Périodiques; Thermoluminescence -- Périodiques; Rayonnement cosmique -- Périodiques; Radiométrie -- Périodiques; 539.77
• DOI: 10.1016/j.radmeas.2023.106911
• Languages: English
• ISSNs: 1350-4487

Abstract

Abstract: The p-channel metal–oxide–semiconductor (pMOS) transistor is a frequently used dosimeter for ionizing radiation, such as γ -rays, since its threshold voltage changes ( Δ V th ) in proportion to the ionization dose. When a pMOS is subjected to γ -ray and neutron radiation fields, the neutrons can influence the Δ V th response to γ -rays. Individual cobalt-60 γ -ray irradiation and sequential irradiation by fission neutrons and subsequent cobalt-60 γ -rays are used to explore the neutron-induced impacts. Experiments show that preceding neutron irradiation can reduce γ -ray sensitivity of Δ V th while accelerating the recovery of Δ V th during the post- γ -irradiation annealing. Additionally, the component of Δ V th induced by oxide charges ( Δ V ox ) is separated from that induced by interface traps as determined by mid-gap tests. This proves that the neutron sensitivity of Δ V ox accounts for that of Δ V th . According to nuclear collision theory, this work suggests that the electronic loss of neutrons rather than the nuclear loss dominates the neutron-induced influences on Δ V th . Highlights: Reports experimental results for preceding neutron induced impacts on pMOS dosimeter. Reports impacts on components of threshold voltage for pMOS dosimeter. Suggest a method to subtract the neutron-induced impacts.