Structural and vibrational properties of α- and π-SnS polymorphs for photovoltaic applications. (15th January 2020)
- Record Type:
- Journal Article
- Title:
- Structural and vibrational properties of α- and π-SnS polymorphs for photovoltaic applications. (15th January 2020)
- Main Title:
- Structural and vibrational properties of α- and π-SnS polymorphs for photovoltaic applications
- Authors:
- Guc, Maxim
Andrade-Arvizu, Jacob
Ahmet, Ibbi Y.
Oliva, Florian
Placidi, Marcel
Alcobé, Xavier
Saucedo, Edgardo
Pérez-Rodríguez, Alejandro
Johnson, Andrew L.
Izquierdo-Roca, Victor - Abstract:
- Abstract: Tin sulphide (SnS) has attracted the attention of the photovoltaic (PV) community due to the combination of desirable optical properties, and its binary and earth abundant elemental composition, which should lead to relatively simple synthesis. However, currently the best SnS based PV device efficiency remains at 4.36%. Limited performance of this material is attributed to band gap alignment issues, deviations in doping concentration and poor film morphology. In this context Raman spectroscopy (RS) analysis can be useful as it facilitates the accurate evaluation of material properties. In this study we present a RS study, supported by X-ray diffraction and wavelength dispersive X-ray measurements, of α- and π-SnS thin films. In particular a complete description of SnS vibrational properties is made using six excitation wavelengths, including excitation energies coupled with certain optical band to band transitions, which leads to close to resonance measurement conditions. This study describes an in-depth analysis of the Raman spectra of both SnS structural polymorphs, including the differences in the number of observed peaks, with their relative intensities and Raman shift. Additionally, we evaluate the impact of low temperature heat treatment on SnS. These results explicitly present how the variation of the [S]/[Sn] ratio in samples deposited by different methods can lead to significant and correlated shifts in the relative positions of Raman peaks, which is onlyAbstract: Tin sulphide (SnS) has attracted the attention of the photovoltaic (PV) community due to the combination of desirable optical properties, and its binary and earth abundant elemental composition, which should lead to relatively simple synthesis. However, currently the best SnS based PV device efficiency remains at 4.36%. Limited performance of this material is attributed to band gap alignment issues, deviations in doping concentration and poor film morphology. In this context Raman spectroscopy (RS) analysis can be useful as it facilitates the accurate evaluation of material properties. In this study we present a RS study, supported by X-ray diffraction and wavelength dispersive X-ray measurements, of α- and π-SnS thin films. In particular a complete description of SnS vibrational properties is made using six excitation wavelengths, including excitation energies coupled with certain optical band to band transitions, which leads to close to resonance measurement conditions. This study describes an in-depth analysis of the Raman spectra of both SnS structural polymorphs, including the differences in the number of observed peaks, with their relative intensities and Raman shift. Additionally, we evaluate the impact of low temperature heat treatment on SnS. These results explicitly present how the variation of the [S]/[Sn] ratio in samples deposited by different methods can lead to significant and correlated shifts in the relative positions of Raman peaks, which is only observed in the α-SnS phase. Furthermore, we discuss the suitability of using Raman spectroscopy based methodologies to extract fine stoichiometric variations in different α-SnS samples. Graphical abstract: Image, graphical abstract … (more)
- Is Part Of:
- Acta materialia. Volume 183(2020)
- Journal:
- Acta materialia
- Issue:
- Volume 183(2020)
- Issue Display:
- Volume 183, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 183
- Issue:
- 2020
- Issue Sort Value:
- 2020-0183-2020-0000
- Page Start:
- 1
- Page End:
- 10
- Publication Date:
- 2020-01-15
- Subjects:
- SnS -- Thin films -- X-ray diffraction -- Raman spectroscopy
Materials -- Periodicals
Materials science -- Periodicals
Materials -- Mechanical properties -- Periodicals
Metallurgy -- Periodicals
Chemistry, Inorganic -- Periodicals
620.112 - Journal URLs:
- http://www.sciencedirect.com/science/journal/13596454 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.actamat.2019.11.016 ↗
- Languages:
- English
- ISSNs:
- 1359-6454
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0629.920000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 25784.xml