Structural and impedance spectroscopy characterization of Stannic oxide electronic system. (2023)

• Record Type: Journal Article
• Authors: Sahoo, Limali; Bhuyan, S.; Tripathy, A.; Das, S.N.
• Is Part Of: Materials today. Volume 74(2023)Part 4
• Page Start: 693
• Page End: 696
• Publication Date: 2023
• Subjects: Solid state -- X-ray diffraction -- Dielectric constant -- Complex impedance; Materials science -- Congresses -- Periodicals; 620.1
• DOI: 10.1016/j.matpr.2022.10.272
• Languages: English
• ISSNs: 2214-7853

Abstract

Abstract: Stannic oxide (SnO2 ) is explored as one well-known material for many potential applications due to its unique electronic properties. The objective is to focus on structural and electrical characteristics of SnO2 electronic material, synthesized through the high-temperature solid-state principle. The sample has a tetragonal system, which is revealed by the X-ray diffraction technique. Different electrical parameters are comprehensively analyzed with the help of impedance spectrometer. The studied material has a relatively high dielectric constant and low tangent loss which furnish it as a suitable applicant for electronic applications.