Experimental evaluation of substrate and annealing conditions on ZnO thin films prepared by sol-gel method. (2020)

• Record Type: Journal Article
• Authors: Lokesh, K.S.; Kumar, J.R. Naveen; Kannantha, Vinayaka; pinto, Thomas; Sampreeth, U.
• Is Part Of: Materials today. Volume 24:Part 2(2020)
• Page Start: 201
• Page End: 208
• Publication Date: 2020
• Subjects: Sol-gel -- Thin film -- Zinc oxide -- Spin coating; Materials science -- Congresses -- Periodicals; 620.1
• DOI: 10.1016/j.matpr.2020.04.268
• Languages: English
• ISSNs: 2214-7853

Abstract

Abstract: In this work, we relate the influence of annealing temperature on crystalline size, film roughness, optical, morphological and electrical properties of ZnO thin films prepared by a spin coating technique. The thin film was annealed at 450˚C for one hour each, and their structural properties were studied using Scanning Electron Microscope, X-ray Diffractometer and Atomic Force Microscope. Resistance measurements using Keithley Electrometer characterized the coatings. The films produced by the spin coating method confirms hexagonal wurtzite structure. The crystallite size of spin-coated etched films annealed& vacuum annealed at 450˚C was ∼15.20 nm and ∼8.81 nm respectively, whereas the crystallite size of spin-coated un-etched films annealed & vacuum annealed at 450˚C was ∼14.92nm and 6.74nm respectively. The resistance measured for the 4 times & 8 times coated ZnO thin film by spin coating method are 110 & 125MΩ respectively for etched and un-etched substrates. Annealing temperature significantly influenced crystallinity and surface roughness of the thin films in the spin coating method.