Prediction of probabilistic transient stability using support vector regression. Issue 1 (2nd January 2023)

• Record Type: Journal Article
• Authors: Shahzad, Umair
• Is Part Of: Australian journal of electrical & electronics engineering. Volume 20:Issue 1(2023)
• Page Start: 35
• Page End: 49
• Publication Date: 2023-01-02
• Subjects: Dynamic security assessment -- machine learning -- soft computing -- support vector machine (SVM) -- transient stability; Electrical engineering -- Periodicals; Electronics -- Periodicals; Periodicals; 621.305
• DOI: 10.1080/1448837X.2022.2112302
• Languages: English
• ISSNs: 1448-837X

Abstract

ABSTRACT: The increasing uncertainty in power systems has brought various challenges, including transient stability assessment. The conventional approaches, such as, time-domain simulation approach and direct method (based on Lyapunov function and transient energy function), to estimate the transient stability are not appropriate for online application, as they suffer from various drawbacks of large computation time (time-domain simulation) and delivering approximate results (direct method). The field of machine learning and soft computing provides a good alternative to the conventional approaches, for transient stability evaluation. Thus, this paper aims to discuss the application of support vector machine (SVM) for predicting the probabilistic transient stability. DIgSILENT PowerFactory was utilised for conducting time-domain simulations (to obtain the training data), and MATLAB was used for support vector regression (SVR) training. For the SVR model, fault type, fault location, fault clearing time, and system load were chosen as the predictors and the transient stability index ( TSI ) was used as the response. Various regression metrics were computed, for the IEEE 14-bus system, to validate the effectiveness of the proposed approach. The results obtained verify the efficiency of the proposed approach and provide a great potential to be applied for online dynamic security assessment (DSA).