Cite
HARVARD Citation
Belanger-Champagne, C. et al. (2023). BETSEE: testing for system-wide effects of single event effects on ITk strip modules. Journal of instrumentation. p. . [Online].
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Belanger-Champagne, C. et al. (2023). BETSEE: testing for system-wide effects of single event effects on ITk strip modules. Journal of instrumentation. p. . [Online].