Transverse emittance measurement in 2D and 4D performed on a Low Energy Beam Transport line: benchmarking and data analysis. (1st January 2023)

• Record Type: Journal Article
• Authors: Osswald, F.; Durand, T.; Heine, M.; Michaud, J.; Poirier, F.; Thomas, J.C.; Traykov, E.
• Is Part Of: Journal of instrumentation. Volume 18:Number 1(2023)
• Publication Date: 2023-01-01
• Subjects: Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors) -- Beam Optics; Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/18/01/P01011
• Languages: English
• ISSNs: 1748-0221

Abstract

Abstract: 2D and 4D transverse phase-space of a low-energy ion-beam is measured with two of the most common emittance scanners. The article covers the description of the installation, the setup, the settings, the experiment and the benchmark of the two emittance meters. We compare the results from three series of measurements and present the advantages and drawbacks of the two systems. Coupling between phase-space planes, correlations and mitigation of deleterious effects are discussed. The influence of background noise and aberrations of trace-space figures on emittance measurements and RMS calculations is highlighted, especially for low density beams and halos. A new data analysis method using noise reduction, filtering, and reconstruction of the emittance figure is described. Finally, some basic concepts of phase-space theory and application to beam transport are recalled.