The Reliability Design of Switch Chip Based on THENA Process Stimulation System. Issue 3 (October 2020)
- Record Type:
- Journal Article
- Title:
- The Reliability Design of Switch Chip Based on THENA Process Stimulation System. Issue 3 (October 2020)
- Main Title:
- The Reliability Design of Switch Chip Based on THENA Process Stimulation System
- Authors:
- Zhao, Zhihuan
Zhao, Zhibin
Jiang, Mingming
Chen, Chuanzhong
Song, Weihai
Zhang, Li
Liu, Lili
Yu, Huijun - Abstract:
- Abstract: This paper mainly focuses on the 2CK6642 silicon switch diode chip, which is mainly used for the surface-mounted packaging device of CLCC-3 metal ceramic. Different from that of ordinary diode, the internal structure of 2CK6642 silicon switch diode has a high resistance region I in the middle of Type P and Type N silicon materials, forming a P-I-N structure. Silvaco TCAD interactive tools, i.e. ATHENA process stimulation system and ATLAS device stimulation system, are used to conduct the design and stimulation of 2CK6642 silicon switch diode chip, so that alternative plugging with external devices could be achieved finally.
- Is Part Of:
- Journal of physics. Volume 1650:Issue 3(2020)
- Journal:
- Journal of physics
- Issue:
- Volume 1650:Issue 3(2020)
- Issue Display:
- Volume 1650, Issue 3 (2020)
- Year:
- 2020
- Volume:
- 1650
- Issue:
- 3
- Issue Sort Value:
- 2020-1650-0003-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-10
- Subjects:
- Physics -- Congresses
530.5 - Journal URLs:
- http://www.iop.org/EJ/journal/1742-6596 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1742-6596/1650/3/032107 ↗
- Languages:
- English
- ISSNs:
- 1742-6588
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5036.223000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 25652.xml