Cite
HARVARD Citation
Yokogawa, R. et al. (2020). Evaluation of Phonon Dispersion Relation for Bulk Silicon Germanium by Inelastic X-ray Scattering. ECS transactions. pp. 465-472. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Yokogawa, R. et al. (2020). Evaluation of Phonon Dispersion Relation for Bulk Silicon Germanium by Inelastic X-ray Scattering. ECS transactions. pp. 465-472. [Online].