Process Defects and Failure Analysis Methods of Crystal Oscillator. Issue 2 (April 2021)

• Record Type: Journal Article
• Authors: Liu, Cong; Gao, Yancai; Cai, Xiuming; Zhou, Wenjuan; Zou, Jinlin
• Is Part Of: Journal of physics. Volume 1885:Issue 2(2021)
• Publication Date: 2021-04
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1885/2/022040
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: The common failure modes of crystal oscillators are vibration stop, waveform abnormality and frequency drift, there are many failure mechanisms, some of which are related to process defects, such as chip process defects, module packaging process defects and crystal process defects. In order to discover the process defects, summarize the performance, appearance, reason and failure analysis methods of its common process defects is necessary. Introduced several common process defects of current SMD crystal oscillators and corresponding analysis methods through specific case analysis.