Free-drop simulation and analysis of Full-screen smartphone based on ABAQUS/CAE. Issue 1 (February 2021)

• Record Type: Journal Article
• Authors: Cao, Zhong; Li, Weijie; Chen, Zhuo; Wang, Feng; Shang, Wenli
• Is Part Of: Journal of physics. Volume 1786:Issue 1(2021)
• Publication Date: 2021-02
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1786/1/012015
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Finite element analysis (FEA) provides numerical modeling and testing methods of stress analysis for products. The time of products development cycle can be shorten and the cost for products physical testing can be reduced with FEA. Drop test is one of the important tools uses for the impact behaviour study of cell phones, which identifies weak design points during the impact behaviour of cell phone. With the development of technology and growing of people's demand, the screen of cell phone is getting bigger and bigger. Full-screen smartphones have become a trend. It is necessary that modeling and analyzing for full-screen smartphones are considered. This study conducts free-drop simulation and analysis on full-screen smartphones based on ABAQUS/CAE.