Detection of Late Blight in Potato Leaves Based on Multi-Feature and SVM Classifier. (April 2020)

• Record Type: Journal Article
• Authors: Liu, Wenjie; Zhang, Yongjun; Fan, Haisheng; Zou, Yongjie; Qin, Yongbin
• Is Part Of: Journal of physics. Volume 1518(2020)
• Publication Date: 2020-04
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1518/1/012045
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Due to the influence of germs and viruses, plants often show various symptoms of diseases and insect pests during the growth process, which leads to a large economic loss of fruit farmers. It also brings a certain economic loss to our society, so prevent earlier and advise growers about plant diseases and insect pests have important value and significance. In this case, this paper proposes a detection method which is based on the combination of HOG, LBP and CSS features with Support Vector Machine (SVM) classifier. This method extracts the histogram of oriented gradients, texture, and color self-similar features of potato leaves, and then training samples with SVM classifier to detect late blight as early as possible in the early stages of potato growth. In addition, this paper proposes a method to increase virtual samples, that is, generating symmetrical samples according to the original samples. Due to the limitation of the number of collected samples, increasing symmetrical samples can expand the diversity of samples. The results show that this method can obtain a detection rate of 92.7%, and has better detection and recognition performance in practical application.