Electrical characterization of glass-ceramic sealant-metallic interconnect joined samples under solid oxide electrolysis cell conditions; influence on the microstructure and composition at the different polarized interfaces. Issue 6 (15th March 2021)

• Record Type: Journal Article
• Authors: Javed, Hassan; Herbrig, Kai; Sabato, Antonio Gianfranco; Ferrero, Domenico; Santarelli, Massimo; Walter, Christian; Smeacetto, Federico
• Is Part Of: Ceramics international. Volume 47:Issue 6(2021)
• Page Start: 8184
• Page End: 8190
• Publication Date: 2021-03-15
• Subjects: Solid oxide cell -- Sealants -- Glass-ceramic -- Electrical resistivity; Ceramics -- Periodicals; Céramique industrielle -- Périodiques; Ceramics; Periodicals; Electronic journals; 666
• DOI: 10.1016/j.ceramint.2020.11.176
• Languages: English
• ISSNs: 0272-8842

Abstract

Abstract: In this study, the electrical resistivity of a glass-ceramic sealant is evaluated at 850 °C, for 2800 h under the applied voltage of 1.6 V. The glass-ceramic sealant is sandwiched between two Crofer22APU plates to produce Crofer22APU/Glass-ceramic/Crofer22APU samples. The Crofer22APU/glass-ceramic/Crofer22APU joints show electrical resistivity around 10 6 -10 7 Ω cm, significantly high to ensure the insulation between two conductive interconnect plates. The detailed SEM-EDS post mortem analysis showed good thermo-mechanical compatibility of the glass-ceramic with the Crofer22APU substrates, thus excluding any detrimental interaction with the metallic interconnect under high applied voltage. XRD analysis of glass-ceramic confirmed the presence of crystalline phases with suitable CTEs, after electrical resistivity under harsh conditions.