Overview of Electromagnetic Compatibility in Automotive Integrated Circuits. (August 2020)

• Record Type: Journal Article
• Authors: Zhang, Jie; Zhang, Xu; Kai Jiang, Guo; Ming Liu, Hai; Fan, Yan
• Is Part Of: Journal of physics. Volume 1607(2020)
• Publication Date: 2020-08
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1607/1/012034
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: This article summarizes the current development situation of automotive integrated circuits, the origin of relevant domestic and foreign standards AEC Q100, IEC 61967, IEC 62132. In addition, this article introduces in detail the test methods of IEC 61967 and IEC 62132 standards, that is radiated emissions, radiated immunity, conducted emissions, conducted immunity, and gives a test block diagram of the relevant test methods. Finally, this article summarizes the status of domestic integrated circuit electromagnetic compatibility testing and standards