A new method for measuring complex relative permittivity of dielectric material by reflection method. Issue 1 (April 2021)

• Record Type: Journal Article
• Authors: Qin, Yao; Wei, Bin; Liu, Shuo; Li, Mingxing; Cai, Chengxin; Hou, Tiangang
• Is Part Of: Journal of physics. Volume 1871:Issue 1(2021)
• Publication Date: 2021-04
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1871/1/012002
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: In this paper, a new lossless free space method for measuring the complex relative permittivity of dielectric material by reflection method is presented. When this method is used to measure the complex relative permittivity of dielectric material, there is no multi-value problem. The measurement system used in this method consists of a horn lens antenna and a vector network analyzer(VNA). In this paper, HFSS microwave simulation software is used to simulate the complex relative permittivity measurement method proposed in this paper. The simulation results show that this method can accurately measure the complex relative permittivity of dielectric material.