Growth and characterization of copper cadmium sulphide thin films. Issue 1 (January 2021)

• Record Type: Journal Article
• Authors: Emegha, J. O.; Damisa, J.; Elete, D. E.; Arijaje, T. E.; Akinpelu, A.; Ogundile, P. O.; Onumejor, C. A
• Is Part Of: Journal of physics. Volume 1734:Issue 1(2021)
• Publication Date: 2021-01
• Subjects: Chemical bath deposition -- CuCdS -- Thin films -- Band gap -- X-ray diffraction; Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1734/1/012045
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Copper cadmium sulphide thin film was deposited onto glass (soda-lime) substrates using chemical bath deposition (CBD) technique at room temperature. Chemical, optical, structural, and microstructural features were examined via the Fourier Transform Infrared Spectroscopy (FTIR), X-ray Diffraction (XRD), UV-Vis Spectroscopy, and High-resolution Transmission Electron Microscopy (HRTEM). FTIR revealed that the associated chemical bond was below the 900 cm-1 marks. The optical band-gap of 2.36 eV was estimated from the absorption analysis. X-ray diffraction measurements reveal that the deposited material is polycrystalline with hexagonal and cubic structures typical of the binary constituents of and thin films. The grain sizes were randomly distributed and ranged between 35 and 60 nm as indicated by the HRTEM.