Knowledge aided expert system for failure analysis of electronic components. (December 2020)

• Record Type: Journal Article
• Authors: Yaru, Cui; Kui, Zhang; Lijing, Yin; Shengbiao, An; Jie, Huang
• Is Part Of: Journal of physics. Volume 1693(2020)
• Publication Date: 2020-12
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1693/1/012201
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Aiming at the importance of failure analysis of electronic components, the complexity of the knowledge system and the high dependence of experts, this paper conducts in-depth research on the application of expert systems. According to the characteristics of component failure analysis, the reasoning fault tree analysis engine is innovatively designed, and the active knowledge assistant technology is introduced to assist analysts to obtain failure mechanism information in real time. The low threshold and high output of failure analysis of electronic components are realized, which fills the gap at home and abroad.