Construction of intelligent testing system for electronic components. (December 2020)

• Record Type: Journal Article
• Authors: Kui, Zhang; Yaru, Cui; Hailong, Zhao; Shengbiao, An; Jie, Huang
• Is Part Of: Journal of physics. Volume 1693(2020)
• Publication Date: 2020-12
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1693/1/012215
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: In order to solve the problems such as unreasonable plan, opaque process, insufficient flexibility and excessive manual participation in the process of screening, identification and quality consistency inspection of electronic components in China, a software and hardware construction scheme of intelligent detection system for electronic components is proposed, which integrates the cutting-edge technologies such as machine vision, deep learning, IOT(internet of things), data mining. Relying on the National Semiconductor Device Quality Supervision and Inspection Center, part of the construction work has been completed, and the information, automation and intelligence of the testing business have been realized.