Automated Test Case Generation for Effective Spectrum-based Fault Localization. (June 2020)

• Record Type: Journal Article
• Authors: Yang, Bo; He, Yuze; Feng, Lixing
• Is Part Of: Journal of physics. Volume 1576(2020)
• Publication Date: 2020-06
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1576/1/012042
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: Software testing is the key to ensuring software quality. Test case generation and software fault localization are two important research objects of testing. Spectrum-based fault localization (SBFL) method is a mainstream dynamic fault localization method, which inputs test cases into the program for execution and collects statement coverage information and execution results. By analysing this information, a fault report can be generated. The performance of SBFL is affected by test case quality. Therefore, this paper proposes a test case generation method based on improved genetic algorithm to assist SBFL. This method uses a small number of initial test cases to execute the program, then uses the XGBoost model to pre-process the spectrum information and generates a list of potential fault statements to guide the iterative process of the genetic algorithm. The experimental results show that the test cases generated using the improved genetic algorithm have certain advantages over the test cases generated by general genetic algorithm and the baseline test cases.