Cite
HARVARD Citation
Guo, W. et al. (2020). Finite Element Simulation of Repeated Upsetting at Elevated Temperature. IOP conference series. 812 (1), p. . [Online].
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Guo, W. et al. (2020). Finite Element Simulation of Repeated Upsetting at Elevated Temperature. IOP conference series. 812 (1), p. . [Online].