Carrier-Induced Degradation in Monocrystalline Silicon: Dependence on the Temperature and Irradiance. Issue 1 (March 2020)
- Record Type:
- Journal Article
- Title:
- Carrier-Induced Degradation in Monocrystalline Silicon: Dependence on the Temperature and Irradiance. Issue 1 (March 2020)
- Main Title:
- Carrier-Induced Degradation in Monocrystalline Silicon: Dependence on the Temperature and Irradiance
- Authors:
- Li, Hailing
Wang, Xinxin
Wang, Wenjing - Abstract:
- Abstract: The dependence of the carrier-induced degradation on the temperature and irradiance is studied. The stability of samples after accelerated degradation and regeneration at different temperature and irradiance are studied also. Minority carrier lifetime and normalized defect density are used to characterize the degradation and regeneration kinetics. The mechanism of temperature and irradiance on degradation is studied and discussed.
- Is Part Of:
- IOP conference series. Volume 774:Issue 1(2020)
- Journal:
- IOP conference series
- Issue:
- Volume 774:Issue 1(2020)
- Issue Display:
- Volume 774, Issue 1 (2020)
- Year:
- 2020
- Volume:
- 774
- Issue:
- 1
- Issue Sort Value:
- 2020-0774-0001-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-03
- Subjects:
- Materials science -- Periodicals
620.1105 - Journal URLs:
- http://iopscience.iop.org/1757-899X ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1757-899X/774/1/012143 ↗
- Languages:
- English
- ISSNs:
- 1757-8981
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 25344.xml