Cite
HARVARD Citation
Woo, H. et al. (2017). Determination of intrinsic mobility of a bilayer oxide thin-film transistor by pulsed I–V method. Nanotechnology. p. . [Online].
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Woo, H. et al. (2017). Determination of intrinsic mobility of a bilayer oxide thin-film transistor by pulsed I–V method. Nanotechnology. p. . [Online].