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HARVARD Citation
Kim, S. et al. (2023). Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution. Quality technology & quantitative management. 20 (2), pp. 236-255. [Online].
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Kim, S. et al. (2023). Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution. Quality technology & quantitative management. 20 (2), pp. 236-255. [Online].