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HARVARD Citation
Ahmad, S. et al. (2023). Investigation of 500 keV Si ion induced surface structuring of Ni and Ti for enhancement of field emission properties. Surface and interface analysis. pp. 113-126. [Online].
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Ahmad, S. et al. (2023). Investigation of 500 keV Si ion induced surface structuring of Ni and Ti for enhancement of field emission properties. Surface and interface analysis. pp. 113-126. [Online].