Cite
HARVARD Citation
Kivi, I. et al. (2015). Changes in SOFC Cathode Crystallographic Structure Induced by Temperature, Potential and Oxygen Partial Pressure Studied Using in-Situ HT-XRD. ECS transactions. pp. 671-679. [Online].
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Kivi, I. et al. (2015). Changes in SOFC Cathode Crystallographic Structure Induced by Temperature, Potential and Oxygen Partial Pressure Studied Using in-Situ HT-XRD. ECS transactions. pp. 671-679. [Online].