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HARVARD Citation
Stevens, A. et al. (n.d.). The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images. Microscopy. pp. 41-51. [Online].
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Stevens, A. et al. (n.d.). The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images. Microscopy. pp. 41-51. [Online].