Grazing‐Incidence Texture Tomography and Diffuse Reflectivity Tomography of an Organic Semiconductor Device Array. Issue 11 (23rd June 2022)

• Record Type: Journal Article
• Authors: Smilgies, Detlef‐M.; Koker, Margaret K. A.; Li, Ruipeng; Shaw, Leo; Bao, Zhenan
• Is Part Of: Chemistry methods. Volume 2:Issue 11(2022)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2022-06-23
• Subjects: device structure -- grazing-incidence scattering -- organic semiconductors -- tomography; Chemistry, Analytic -- Periodicals; 543
• DOI: 10.1002/cmtd.202200016
• Languages: English
• ISSNs: 2628-9725

Abstract

Abstract: The use of grazing‐incidence scattering methods for the characterization of 2D patterned organic thin films is limited due to the elongated 1D footprint of the X‐ray beam on the sample. However, this characteristic feature can be turned into an advantage, when combined with tomographic reconstruction. In this pilot study we show, how the use of a chosen texture reflection and a diffuse reflectivity signal can each provide 2D images of the deposits, simultaneously revealing the organic film's crystal orientation and the location of the metal electrodes in a field‐effect transistor structure from a single sequence of diffraction images. Abstract : Grazing incidence scattering methods have much contributed to analyze the morphology of organic semiconductor thin films. Here grazing‐incidence tomographical methods are introduced to elucidate morphological information in a 2D patterned device structure.