Cite
HARVARD Citation
Liu, X. et al. (2022). Cause analysis of stamping cracking and concealed cracking of tailgate inner plate. Journal of physics. 2390 (1), p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Liu, X. et al. (2022). Cause analysis of stamping cracking and concealed cracking of tailgate inner plate. Journal of physics. 2390 (1), p. . [Online].