Accurate three-dimensional measurement based on polarization-defocused encoded structured light. (December 2022)

• Record Type: Journal Article
• Authors: Zhu, Zhenmin; Dong, Yawen; You, Duoduo; Sun, Xiang
• Is Part Of: Measurement. Volume 205(2023)
• Publication Date: 2022-12
• Subjects: Polarization encoding -- Structured light -- Phase-measuring profilometry -- Defocused projection; Weights and measures -- Periodicals; Measurement -- Periodicals; Measurement; Weights and measures; Periodicals; 530.8
• DOI: 10.1016/j.measurement.2022.112128
• Languages: English
• ISSNs: 0263-2241

Abstract

Highlights: A coding strategy based on polarization and light intensity is adopted. The method can be easily combined into different types of phase-shifting methods. Defocused binary fringe projection method encodes the degree of polarization. Abstract: Polarized structured light is an important method to measure shiny surface. In this paper, a type of structured light encoded by polarized light is proposed. A coding strategy based on polarization and light intensity is adopted to improve the quality of the projection fringe. A type of robust phase-shift fringe is generated using the characteristics of a liquid crystal display projector by the defocus method. Compared with other polarized structured light coding methods, the proposed method requires simpler equipment and no additional custom instruments. Experiments show that the method could effectively improve the robustness of fringes. Experiments suggest that the range accuracy is improved by 2.4%.