Aberration corrections for non‐Bragg–Brentano diffraction geometries. Issue 1 (31st January 2017)

• Record Type: Journal Article
• Authors: Rowles, Matthew R.; Buckley, Craig E.
• Is Part Of: Journal of applied crystallography. Volume 50:Issue 1(2017)
• Page Start: 240
• Page End: 251
• Publication Date: 2017-01-31
• Subjects: fundamental parameters -- Rietveld modelling -- aberration corrections; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576717000085
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : A variety of physically meaningful geometrical and preferred orientation corrections are derived and summarized. The application of these corrections allows for realistic modelling based on the fundamental parameters approach to be undertaken. Abstract : The construction of peak intensity, profile and displacement aberration functions based on the geometry of a powder diffraction measurement allows for physically realistic corrections to be applied in Rietveld modelling through a fundamental parameters approach. Parallel‐beam corrections for asymmetric reflection and Debye–Scherrer geometry are summarized, and corrections for thin‐plate transmission are derived and validated. Geometrically correct implementations of preferred orientation models are also summarized.