Peripheral Nanostructured Porous Silicon Boosts Static and Dynamic Performance of Integrated Electronic Devices. (10th November 2020)
- Record Type:
- Journal Article
- Title:
- Peripheral Nanostructured Porous Silicon Boosts Static and Dynamic Performance of Integrated Electronic Devices. (10th November 2020)
- Main Title:
- Peripheral Nanostructured Porous Silicon Boosts Static and Dynamic Performance of Integrated Electronic Devices
- Authors:
- Paghi, Alessandro
Strambini, Lucanos
Toia, Fabrizio F.
Sambi, Marco
Marchesi, Marco
Depetro, Riccardo
Morelli, Marco
Barillaro, Giuseppe - Abstract:
- Abstract: Nanomaterials hold the promise of revolutionizing electronics and, in turn, its applications, thanks to the unique properties of charge carriers traveling in structures with length scale down to a few nanometers. Here, the tremendous reduction of mobility and lifetime of charge carriers when traveling in randomly arranged nanostructured silicon crystallites, namely, nanostructured porous silicon (n‐PSi), is leveraged to simultaneously improve the turn‐off switching speed and reverse operation voltage of solid‐state devices integrated nearby. As a proof‐of‐concept application, it is shown that the integration of peripheral n‐PSi next to solid‐state diodes fabricated by an industrial process, namely, PSi‐nanostructured diodes, reliably improves both the breakdown voltage (>2× increase) and switching time (30% reduction), with respect to those of reference diodes without n‐PSi, with no significant drawbacks on other diode parameters. This effect is shown to be robust with respect to n‐PSi preparation conditions and diode architectures, thus paving a new way toward groundbreaking n‐PSi applications in microelectronics. Abstract : Here, a tremendous reduction in mobility and lifetime of charge carriers when traveling in randomly arranged nanostructured silicon crystallites, namely, nanostructured porous silicon (n‐PSi), is leveraged to simultaneously improve the turn‐off switching speed and reverse operation voltage of solid‐state diodes integrated nearby.
- Is Part Of:
- Advanced Electronic Materials. Volume 6:Number 12(2020)
- Journal:
- Advanced Electronic Materials
- Issue:
- Volume 6:Number 12(2020)
- Issue Display:
- Volume 6, Issue 12 (2020)
- Year:
- 2020
- Volume:
- 6
- Issue:
- 12
- Issue Sort Value:
- 2020-0006-0012-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2020-11-10
- Subjects:
- breakdown voltage -- carrier lifetime -- carrier mobility -- electronic devices -- nanostructured porous silicon -- solid‐state diodes
Materials -- Electric properties -- Periodicals
Materials science -- Periodicals
Magnetic materials -- Periodicals
Electronic apparatus and appliances -- Periodicals
537 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2199-160X ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/aelm.202000615 ↗
- Languages:
- English
- ISSNs:
- 2199-160X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.848400
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 24565.xml