Cite
HARVARD Citation
Santra, T. et al. (2022). Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. Microelectronics journal. p. . [Online].
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Santra, T. et al. (2022). Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. Microelectronics journal. p. . [Online].