Cite
HARVARD Citation
Dastan, D. et al. (2023). Influence of heat treatment on H2S gas sensing features of NiO thin films deposited via thermal evaporation technique. Materials science in semiconductor processing. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Dastan, D. et al. (2023). Influence of heat treatment on H2S gas sensing features of NiO thin films deposited via thermal evaporation technique. Materials science in semiconductor processing. p. . [Online].