Cite
HARVARD Citation
Saha, R. et al. (2022). Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. Microelectronics journal. p. . [Online].
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Saha, R. et al. (2022). Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. Microelectronics journal. p. . [Online].