Fill Factor Losses and Deviations from the Superposition Principle in Lead Halide Perovskite Solar Cells. Issue 11 (7th September 2022)

• Record Type: Journal Article
• Authors: Grabowski, David; Liu, Zhifa; Schöpe, Gunnar; Rau, Uwe; Kirchartz, Thomas
• Is Part Of: Solar RRL. Volume 6:Issue 11(2022)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2022-09-07
• Subjects: charge collection -- mobility -- photoluminescence -- recombination -- series resistance; Solar energy -- Periodicals; Photovoltaic power generation -- Periodicals; Solar energy -- Research -- Periodicals; Photovoltaic power generation -- Research -- Periodicals; Periodicals; 333.7923
• DOI: 10.1002/solr.202200507
• Languages: English
• ISSNs: 2367-198X

Abstract

Abstract : The enhancement of the fill factor in the current generation of perovskite solar cells is the key for further efficiency improvement. Thus, methods to quantify the fill factor losses are urgently needed. Two methods are presented to quantify losses due to the finite resistance of the semiconducting layers of the solar cell as well as its contacts. The first method is based on the comparison between the voltage in the dark and under illumination analyzed at equal recombination current density and results in a voltage‐dependent series resistance. Furthermore, the method reveals the existence of a strong photoshunt under illumination. The second method is based on measuring the photoluminescence of perovskite solar cells as a function of applied voltage. Thereby, the recombination current is determined as a function of voltage from short circuit to open circuit, and the presence of the photoshunt is explained with a high resistance of the electron and/or hole transport layers combined with field screening in the absorber. Abstract : A major challenge in the characterization of perovskite solar cells is to quantify recombination losses caused by slow charge transport. Voltage‐dependent photoluminescence is shown to provide an opportunity to quantitatively determine the current density lost due to recombination from short circuit to open circuit.