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HARVARD Citation
Hoffmann, R. et al. (2021). Front Cover: Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc: Thin‐Film Transistor and Sensor Behavior of ZnO Films and Rods (Chem. Eur. J. 17/2021). Chemistry. 27 (17), p. 5307. [Online].