Cite
HARVARD Citation
Kim, D. et al. (2022). Power cycling tests under driving ΔTj = 125 °C on the Cu clip bonded EV power module. Microelectronics and reliability. p. . [Online].
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Kim, D. et al. (2022). Power cycling tests under driving ΔTj = 125 °C on the Cu clip bonded EV power module. Microelectronics and reliability. p. . [Online].