Cite
HARVARD Citation
Devoge, P. et al. (2022). Hot-carrier reliability and performance study of transistors with variable gate-to-drain/source overlap. Microelectronics and reliability. p. . [Online].
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Devoge, P. et al. (2022). Hot-carrier reliability and performance study of transistors with variable gate-to-drain/source overlap. Microelectronics and reliability. p. . [Online].