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HARVARD Citation
Sobas, J. et al. (2022). Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. Microelectronics and reliability. p. . [Online].
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Sobas, J. et al. (2022). Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. Microelectronics and reliability. p. . [Online].