Cite
HARVARD Citation
Fregolent, M. et al. (2022). Isolation properties and failure mechanisms of vertical Pt / n-GaN SBDs. Microelectronics and reliability. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Fregolent, M. et al. (2022). Isolation properties and failure mechanisms of vertical Pt / n-GaN SBDs. Microelectronics and reliability. p. . [Online].