Cite
HARVARD Citation
Ortiz Gonzalez, J. et al. (2022). Benchmarking the robustness of Si and SiC MOSFETs: Unclamped inductive switching and short-circuit performance. Microelectronics and reliability. p. . [Online].
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Ortiz Gonzalez, J. et al. (2022). Benchmarking the robustness of Si and SiC MOSFETs: Unclamped inductive switching and short-circuit performance. Microelectronics and reliability. p. . [Online].