Step‐Climbing Epitaxy of Layered Materials with Giant Out‐of‐Plane Lattice Mismatch. Issue 42 (15th September 2022)
- Record Type:
- Journal Article
- Title:
- Step‐Climbing Epitaxy of Layered Materials with Giant Out‐of‐Plane Lattice Mismatch. Issue 42 (15th September 2022)
- Main Title:
- Step‐Climbing Epitaxy of Layered Materials with Giant Out‐of‐Plane Lattice Mismatch
- Authors:
- Zhou, Xuehan
Liang, Yan
Fu, Huixia
Zhu, Ruixue
Wang, Jingyue
Cong, Xuzhong
Tan, Congwei
Zhang, Congcong
Zhang, Yichi
Wang, Yani
Xu, Qijia
Gao, Peng
Peng, Hailin - Abstract:
- Abstract: Heteroepitaxy with large lattice mismatch remains a great challenge for high‐quality epifilm growth. Although great efforts have been devoted to epifilm growth with an in‐plane lattice mismatch, the epitaxy of 2D layered crystals on stepped substrates with a giant out‐of‐plane lattice mismatch is seldom reported. Here, taking the molecular‐beam epitaxy of 2D semiconducting Bi2 O2 Se on 3D SrTiO3 substrates as an example, a step‐climbing epitaxy growth strategy is proposed, in which the n ‐th ( n = 1, 2, 3…) epilayer climbs the step with height difference from out‐of‐plane lattice mismatch and continues to grow the n +1‐th epilayer. Step‐climbing epitaxy can spontaneously relax and release the strain from the out‐of‐plane lattice mismatch, which ensures the high quality of large‐area epitaxial films. Wafer‐scale uniform 2D Bi2 O2 Se single‐crystal films with controllable thickness can be obtained via step‐climbing epitaxy. Most notably, one‐unit‐cell Bi2 O2 Se films (1.2 nm thick) exhibit a high Hall mobility of 180 cm 2 V −1 s −1 at room temperature, which exceeds that of silicon and other 2D semiconductors with comparable thickness. As an out‐of‐plane lattice mismatch is generally present in the epitaxy of layered materials, the step‐climbing epitaxy strategy expands the existing epitaxial growth theory and provides guidance toward the high‐quality synthesis of layered materials. Abstract : A step‐climbing epitaxy growth strategy is proposed, in which epilayersAbstract: Heteroepitaxy with large lattice mismatch remains a great challenge for high‐quality epifilm growth. Although great efforts have been devoted to epifilm growth with an in‐plane lattice mismatch, the epitaxy of 2D layered crystals on stepped substrates with a giant out‐of‐plane lattice mismatch is seldom reported. Here, taking the molecular‐beam epitaxy of 2D semiconducting Bi2 O2 Se on 3D SrTiO3 substrates as an example, a step‐climbing epitaxy growth strategy is proposed, in which the n ‐th ( n = 1, 2, 3…) epilayer climbs the step with height difference from out‐of‐plane lattice mismatch and continues to grow the n +1‐th epilayer. Step‐climbing epitaxy can spontaneously relax and release the strain from the out‐of‐plane lattice mismatch, which ensures the high quality of large‐area epitaxial films. Wafer‐scale uniform 2D Bi2 O2 Se single‐crystal films with controllable thickness can be obtained via step‐climbing epitaxy. Most notably, one‐unit‐cell Bi2 O2 Se films (1.2 nm thick) exhibit a high Hall mobility of 180 cm 2 V −1 s −1 at room temperature, which exceeds that of silicon and other 2D semiconductors with comparable thickness. As an out‐of‐plane lattice mismatch is generally present in the epitaxy of layered materials, the step‐climbing epitaxy strategy expands the existing epitaxial growth theory and provides guidance toward the high‐quality synthesis of layered materials. Abstract : A step‐climbing epitaxy growth strategy is proposed, in which epilayers grow across the stepped surfaces and form continuous films. Based on the step‐climbing epitaxy, wafer‐scale uniform 2D Bi2 O2 Se films with controllable thickness can be obtained. One‐unit‐cell films exhibit a high room‐temperature Hall mobility of 180 cm 2 V −1 s −1, which exceeds that of silicon and other 2D semiconductors with comparable thickness. … (more)
- Is Part Of:
- Advanced materials. Volume 34:Issue 42(2022)
- Journal:
- Advanced materials
- Issue:
- Volume 34:Issue 42(2022)
- Issue Display:
- Volume 34, Issue 42 (2022)
- Year:
- 2022
- Volume:
- 34
- Issue:
- 42
- Issue Sort Value:
- 2022-0034-0042-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2022-09-15
- Subjects:
- bismuth oxyselenide -- epitaxial growth -- high mobility -- layered materials -- wafer‐scale single‐crystal thin films
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1521-4095 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adma.202202754 ↗
- Languages:
- English
- ISSNs:
- 0935-9648
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.897800
British Library DSC - BLDSS-3PM
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- 24145.xml