Dual-Wavelength Y-Branch Distributed Bragg Reflector Diode Laser at 785 Nanometers for Shifted Excitation Raman Difference Spectroscopy. Issue 8 (August 2014)

• Record Type: Journal Article
• Authors: Maiwald, Martin; Eppich, Bernd; Fricke, Jörg; Ginolas, Arnim; Bugge, Frank; Sumpf, Bernd; Erbert, Götz; Tränkle, Günther
• Is Part Of: Applied spectroscopy. Volume 68:Issue 8(2014)
• Page Start: 838
• Page End: 843
• Publication Date: 2014-08
• Subjects: Distributed Bragg reflector -- DBR diode laser -- Raman spectroscopy -- Y-branch -- 785 nm -- Shifted excitation Raman difference spectroscopy -- SERDS; Spectrum analysis -- Periodicals; 543.505
• DOI: 10.1366/13-07331
• Languages: English
• ISSNs: 0003-7028

Abstract

A dual-wavelength Y-branch distributed Bragg reflector (DBR) diode laser at 785 nm is presented as an excitation light source for shifted excitation Raman difference spectroscopy (SERDS). The monolithic device was realized with deeply etched surface DBR gratings using one-step epitaxy. An optical output power of 140 mW was obtained in continuous-wave (CW) operation for each laser cavity, with emission wavelengths of the device at 784.50 and 785.12 nm. A spectral width of the laser emission of 30 pm (0.5 cm −1 ), including 95% of optical power, was measured. The mean spectral distance of both excitation lines is 0.63 nm (10.2 cm −1 ) over the whole operating range. Raman experiments using polystyrene as the test sample and ambient light as the interference source were carried out and demonstrate the suitability of the dual-wavelength diode laser for SERDS.