Cite
HARVARD Citation
Seo, S. et al. (2021). Bias stress instability in multilayered MoTe2 field effect transistors under DC and pulse‐mode operation. Electronics letters. 57 (4), pp. 193-195. [Online].
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Seo, S. et al. (2021). Bias stress instability in multilayered MoTe2 field effect transistors under DC and pulse‐mode operation. Electronics letters. 57 (4), pp. 193-195. [Online].