Cite
HARVARD Citation
Doss, R. et al. (2022). Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model. Advances in materials science and engineering. p. . [Online].
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Doss, R. et al. (2022). Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model. Advances in materials science and engineering. p. . [Online].