Cite
HARVARD Citation
Liao, X. et al. (2022). Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes. Microelectronics journal. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Liao, X. et al. (2022). Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes. Microelectronics journal. p. . [Online].