Thermomechanical properties and oxidation resistance of Ce–Si alloyed Ti–Al–N thin films. (August 2019)
- Record Type:
- Journal Article
- Title:
- Thermomechanical properties and oxidation resistance of Ce–Si alloyed Ti–Al–N thin films. (August 2019)
- Main Title:
- Thermomechanical properties and oxidation resistance of Ce–Si alloyed Ti–Al–N thin films
- Authors:
- Asanuma, H.
Klimashin, F.F.
Polcik, P.
Kolozsvari, S.
Riedl, H.
Mayrhofer, P.H. - Abstract:
- Abstract: Within this study, we show that single-phase face centered cubic (fcc) Ti0.47 Al0.46 Ce0.02 Si0.05 N coatings (sputtered from Ti0.37 Al0.57 Ce0.02 Si0.04 targets plus the addition of Ti) outperform their single-phase fcc Ti0.49 Al0.51 N counterparts (sputtered from Ti0.40 Al0.60 targets plus the same addition of Ti). The deposition rate increases by more than 43% and also the hardness of as-deposited Ti0.47 Al0.46 Ce0.02 Si0.05 N coatings is with 39.9 ± 1.2 GPa (on sapphire) 13% higher. Furthermore, this Ce–Si alloyed coating shows a remarkably higher thermal stability, represented by a higher annealing temperature (1200 °C instead of 900 °C) after which hexagonal structured wurtzite-type AlN (w-AlN) can be detected. They also show a more parabolic like oxide growth rate (4.13·10 −7 and 1.13·10 −5 μm 2 /s at 850 and 950 °C) during the 10-h-oxidation experiment, whereas that of Ti0.49 Al0.51 N is close to linear already at 850 °C (especially after ∼2 h). The postponed w-AlN formation guarantees that the hardness of Ti0.47 Al0.46 Ce0.02 Si0.05 N is still 40.8 ± 1.6 GPa even after annealing at 1100 °C. Our results clearly demonstrate that the addition of 2 mol% CeSi2 to Ti–Al targets allows to increase the sputter rate and leads to Ce–Si alloyed nitride coatings with improved thermomechanical properties and oxidation resistance. Highlights: Alloying Ti–Al targets with 2 mol% CeSi2 allows to increase the sputter rate. The Ce–Si alloyed Ti–Al–N coating shows aAbstract: Within this study, we show that single-phase face centered cubic (fcc) Ti0.47 Al0.46 Ce0.02 Si0.05 N coatings (sputtered from Ti0.37 Al0.57 Ce0.02 Si0.04 targets plus the addition of Ti) outperform their single-phase fcc Ti0.49 Al0.51 N counterparts (sputtered from Ti0.40 Al0.60 targets plus the same addition of Ti). The deposition rate increases by more than 43% and also the hardness of as-deposited Ti0.47 Al0.46 Ce0.02 Si0.05 N coatings is with 39.9 ± 1.2 GPa (on sapphire) 13% higher. Furthermore, this Ce–Si alloyed coating shows a remarkably higher thermal stability, represented by a higher annealing temperature (1200 °C instead of 900 °C) after which hexagonal structured wurtzite-type AlN (w-AlN) can be detected. They also show a more parabolic like oxide growth rate (4.13·10 −7 and 1.13·10 −5 μm 2 /s at 850 and 950 °C) during the 10-h-oxidation experiment, whereas that of Ti0.49 Al0.51 N is close to linear already at 850 °C (especially after ∼2 h). The postponed w-AlN formation guarantees that the hardness of Ti0.47 Al0.46 Ce0.02 Si0.05 N is still 40.8 ± 1.6 GPa even after annealing at 1100 °C. Our results clearly demonstrate that the addition of 2 mol% CeSi2 to Ti–Al targets allows to increase the sputter rate and leads to Ce–Si alloyed nitride coatings with improved thermomechanical properties and oxidation resistance. Highlights: Alloying Ti–Al targets with 2 mol% CeSi2 allows to increase the sputter rate. The Ce–Si alloyed Ti–Al–N coating shows a significantly higher thermal stability. The hexagonal AlN formation upon annealing, is postponed from 900 to 1200 °C when Ti–Al–N is alloyed with Ce–Si. The oxidation resistance of Ce–Si alloyed Ti–Al–N is considerably higher than that of Ti–Al–N. … (more)
- Is Part Of:
- Vacuum. Volume 166(2019)
- Journal:
- Vacuum
- Issue:
- Volume 166(2019)
- Issue Display:
- Volume 166, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 166
- Issue:
- 2019
- Issue Sort Value:
- 2019-0166-2019-0000
- Page Start:
- 231
- Page End:
- 238
- Publication Date:
- 2019-08
- Subjects:
- Ti1–xAlxN -- Cerium -- Silicon -- Thermal stability -- Oxidation resistance
Vacuum -- Periodicals
621.55 - Journal URLs:
- http://www.elsevier.com/journals ↗
http://www.sciencedirect.com/science/journal/0042207X ↗ - DOI:
- 10.1016/j.vacuum.2019.05.016 ↗
- Languages:
- English
- ISSNs:
- 0042-207X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 9139.000000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 23818.xml