Cite
HARVARD Citation
Koyanagi, T. et al. (2021). X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress. Scripta materialia. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Koyanagi, T. et al. (2021). X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress. Scripta materialia. p. . [Online].